ХАРАКТЕРИСТИКА МИКРОСТРУКТУРЫ ВЫСОКОТЕМПЕРАТУРНЫХ МЕХАНИЗМОВ В СПЛАВЕ NB-TI-SI

The FIB (focused ion beam) preparation technique allowed observation of microscopic deformation mechanisms in some cases. However, the difficulty of the technique, in the case of plasticity investigations, is that it allows only the observation of a few crystallographic grains. Here, 4 FIB thin foils have been investigated, in which the plasticity mechanisms could be identified in details.